Industrial Automatic Control Systems and Controllers Annotation << Back Position Parity Method for PSF Detection P.V. VYBORNOV A new technique for passive and active pattern-sensitive faults detection is offered. The technique allows to obtain all possible combinations in any arbitrary pair and triplet of adjacent cells that enables 100% coverage for the faults involving 3 and 4 cells (PSF3 and PSF4). All necessary fault activation sets can be obtained by initial array fillings, while activating transitions are made by an element of nondestructive test {↑(re,wē,rē,we,re); ↑(re)} whose passes are executed after each filling. Keywords: RAM testing, pattern sensitive faults, march tests. Contacts: E-mail: jaguey@rambler.ru Pp. 46-54.