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Industrial Automatic Control Systems and Controllers Annotation << Back
Spectral and Temporal Method for Measuring
the Thermal Resistance of Semiconductor Devices |
Smirnov V.I.
Sergeyv V.A.
Gavrikov A.A.
Reviewed two methods of measuring the thermal impedance of semiconductor devices. The first method (JESD51-1 standard) is based on measuring the temperature of the p-n junction in the process of heating it with the power step. In the second method, heating realized by varying power harmonically, thermal impedance is determined by the ratio of the first harmonics of the temperature of p-n junction and the heating power. The simulation showed that both methods gives the same results. The accuracy of the spectral method is superior to JESD51-1 standard, but inferior by the duration of one measuring.
Keywords: thermal resistance; frequency method; thermo physical model.
Contacts: E-mail: a.gavrikoff@gmail.com
Pp. 58-63. |
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