Industrial Automatic Control Systems and Controllers Annotation << Back Device for measuring the thickness of metal layers in the manufacture of thin-film microstrip boards Yu.V. MOSCHENSKY, E.Yu. MOSCHENSKAYA, A.V. GROKHOVSKOY, E.V. ZOTOV, S.V. FEDOTOV A device for measuring the thickness of metal layers in the process of manufacturing thin-film microstrip circuit boards. A method for measuring the thickness, allowing to estimate a single-layer and multilayer metal coatings, and presents options for its introduction into the process. We describe the functional diagram of the device. The results of experimental evaluation of the reliability of a method of measuring the thickness of metallic coatings by the method of local electrochemical analysis. Keywords: the amount of electricity, control the thickness, the local electrochemical analysis, clamping the cell, the thickness of coatings, thin-film microstrip board. Contacts: e-mail: rtu@samgtu.ru Pp. 67-70.