Industrial Automatic Control Systems and Controllers Annotation << Back Algorithm of Recognition of Functional Cells of Topologies of Integrated Circuits on the Basic Matrix Chip M.Yu. Konyshev, A.V. Pankratov, I.M. Bulaev An article describes an approach to the pre-processing of digital images of the metallization layers of semi-custom integrated circuits crystals on gate-array, the implementation of which allows to effectively select vias (contacts) in such images. An algorithm for recognizing functional cells of the topology of an integrated circuit on gate-array according to the structures formed by vias is proposed. Keywords: semi-custom integrated circuits; gate-array; engineering analysis; reverse engineering; digital gray-scale image; pattern recognition; optical microscopy. Contacts: E-mail: misha-kon@mail.ru, E-mail: pank75_75@mail.ru, E-mail: iliabulaev57@gmail.com Pp. 15-22.