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Industrial Automatic Control Systems and Controllers Annotation << Back
Model of Digital Image of Metallization Layer of Application Specific Integrated Circuit on Gate-array |
I.M. Bulaev
The article proposed a method of parametric modeling of digital images contain integrated circuits on gate-array metallization layers. The proposed method of modeling takes into account the peculiarities of process and the channel of obtaining of the metallization layers of integrated circuits crystals in process of reverse engineering, as well as the spatial position of the vias. A modeling algorithm developed based on the proposed model is present.
Keywords: parametric image modeling; application specific integrated circuits; gate-array, reverse engineering.
DOI: 10.25791/asu.10.2019.936
Contacts: -
Pp. 40-48. |
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